SELLEST PODCASTIST 🔗

Värskendamise sagedus:
weekly
Inglise
Ühendkuningriik
20 jagu
alates 17. september 2009
episodic

VIIMANE OSA 🔗

Outline:Background informationPrinciples of reliability physicsClassification of Electronic ReliabilityStructure Defects in Electronic MaterialsConclusions

OTSI VARASEMAID OSASID

Otsi kanali [Audio] Nanostructured Electronic Devices: Percolation and Reliability viimaseid osasid.

EELMISED OSAD

Outline:Breakdown in gas dielectric and Paschen’s lawSpatial and temporal dynamics during breakdownBreakdown in bulk oxides: puzzleTheory of pre-existing defects: Thin oxidesTheory of pre-existing defects: thick oxidesConclusions
Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions
Outline:Introduction: definitions and review
Reaction diffusion in fractal volumesCarrier transport in BH solar cellsAll phase transitions are not fractalConclusions
Vastutamatussäte: Sellele lehele manustatud taskuhäälingusaade ja kunstiteosed pärinevad Muhammad A. Alam-lt, mis on selle omaniku omand ja ei ole seotud ettevõttega Listen Notes, Inc.