[Audio] Nanostructured Electronic Devices: Percolation and Reliability
[Audio] Nanostructured Electronic Devices: Percolation and Reliability
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Lecture 10: Interface Damage & Negative Bias Temperature Instability

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ABOUT THIS EPISODE

Outline:Background informationNBTI interpreted by R-D modelThe act of measurement and observed quantityNBTI vs. Light-induced DegradationPossibility of Degradation-free TransistorsConclusions
English
United Kingdom
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Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

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Lecture 7: On Reliability and Randomness in Electronic Devices

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Lecture 10: Interface Damage & Negative Bias Temperature Instability

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Lecture 9: Breakdown in Thick Dielectrics

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